source:
XIOS/dev/dev_trunk_omp/GENERIC_TESTCASE/test_function
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1715
Name | Size | Rev | Age | Author | Last Change |
---|---|---|---|---|---|
../ | |||||
test_average | 1715 | 5 years | yushan | Generic_testcase : add sub-sub folder for tests | |
test_maximum | 1715 | 5 years | yushan | Generic_testcase : add sub-sub folder for tests | |
test_minimum | 1715 | 5 years | yushan | Generic_testcase : add sub-sub folder for tests | |
test_sum | 1715 | 5 years | yushan | Generic_testcase : add sub-sub folder for tests | |
CMakeLists.txt | 249 bytes | 1715 | 5 years | yushan | Generic_testcase : add sub-sub folder for tests |
context_atm.xml | 12.0 KB | 1714 | 5 years | yushan | Generic_testcase : Using CMake to generate tests |
context_grid_dynamico.xml | 503 bytes | 1694 | 5 years | yushan | Generic_testcase : add one folder for testing the scalar, axis, domain and … |
dynamico_grid.nc | 420.1 KB | 1694 | 5 years | yushan | Generic_testcase : add one folder for testing the scalar, axis, domain and … |
iodef.xml | 2.7 KB | 1712 | 5 years | yushan | Generic_testcase : update iodef configurations |
job.sh | 1.4 KB | 1694 | 5 years | yushan | Generic_testcase : add one folder for testing the scalar, axis, domain and … |
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