Changeset 1701 for XIOS/dev/dev_trunk_omp/GENERIC_TESTCASE
- Timestamp:
- 09/10/19 16:48:33 (5 years ago)
- Location:
- XIOS/dev/dev_trunk_omp/GENERIC_TESTCASE/test_function
- Files:
-
- 6 added
- 1 deleted
- 3 edited
Legend:
- Unmodified
- Added
- Removed
-
XIOS/dev/dev_trunk_omp/GENERIC_TESTCASE/test_function/context_atm.xml
r1699 r1701 369 369 </file> 370 370 371 <file id="atm_output _operation" output_freq="4ts" enabled="true">371 <file id="atm_output" output_freq="4ts" enabled="true"> 372 372 <field id="field2D_ave" field_ref="field2D" operation="average" enabled="true"/> 373 373 <field id="field2D_max" field_ref="field2D" operation="maximum" enabled="true"/> -
XIOS/dev/dev_trunk_omp/GENERIC_TESTCASE/test_function/iodef.xml
r1694 r1701 1 1 <?xml version="1.0"?> 2 2 3 <simulation> 3 4 -
XIOS/dev/dev_trunk_omp/GENERIC_TESTCASE/test_function/param.def
r1694 r1701 1 1 ¶ms_run 2 duration='1d' 3 nb_proc_atm=8 2 UsingServer2 = true 3 RatioServer2 = 50 4 NumberPoolsServer2 = 1 5 nb_proc_atm = 8 6 NumberServers = 4 7 duration = '2d' 4 8 / 9
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